آنالیز میکروسکوپ تونلی روبشی STM و میکروسکوپ نیروی روبشی SFM

scanning tunneling microscope (STM) 

Scanning Force Microscopy (SFM)

آنالیز میکروسکوپ تونلی روبشی STM و میکروسکوپ نیروی روبشی  SFM

ABSTRACT

Scanning tunneling microscopy (STM) and its offspring, scanning force microscopy (SFM) , are real-space imaging techniques that can produce topographic images of a surface with atomic resolution in all three dimensions. Almost any solid surface can be studied with STM or SFM : insulators, semiconductors, and conductors, transparent as well as opaque materials. Surfaces can be studied in air, in liquid, or in ultrahigh vacuum, with fields of view from atoms to greater than 250*250um. With this flexibility in both the operating environment and types of samples that can be studied, STM/SFM is a powerful imaging system.

 

طیف سنجی نشر اتمی با پلاسمای جفت شدۀ القایی

Inductively coupled plasma atomic emission spectroscopy

طیف سنجی نشر اتمی با پلاسمای جفت شدۀ القایی

ABSTRACT

Inductively coupled plasma atomic emission spectroscopy (ICP-AES) is an analytical technique for elemental determinations in the concentration range of major to trace based on the principles of atomic spectroscopy. In theory, the technique applies to all elements except argon, and samples may be introduced as liquids, gases, or solids. In practice, favorable analytical results are obtained for approximately 70 elements, with detection limits usually attainable at the parts per billion level, and most samples are introduced in liquid form as aqueous solutions. The technique has found widespread application in the metallurgical, geological, environmental, agricultural, industrial, and biological fields and is an important technique in the modem analytical laboratory.

 

روش فیلترینگ غیرخطی برای حذف صدای ریزنگار HR(S)TEM

A nonlinear filtering algorithm for denoising HR(S)TEM micrographs

روش فیلترینگ غیرخطی برای حذف صدای ریزنگارهای HR(S)TEM

ABSTRACT

Noise reduction of micrographs is often an essential task in high resolution (scanning) transmission electron microscopy (HR(S)TEM) either for a higher visual quality or for a more accurate quantification. Since HR(S)TEM studies are often aimed at resolving periodic atomistic columns and their non-periodic deviation at defects, it is important to develop a noise reduction algorithm that can simultaneously handle both periodic and non-periodic features properly. In this work, a nonlinear filtering algorithm is developed based on widely used techniques of low-pass filter and Wiener filter, which can efficiently reduce noise without noticeable artifacts even in HR(S)TEM micrographs with contrast of variation of background and defects. The developed nonlinear filtering algorithm is particularly suitable for quantitative electron microscopy, and is also of great interest for beam sensitive samples, in situ analyses, and atomic resolution EFTEM.

 

آنالیز SEM و اشعه ایکس - SEM and X-ray Microanalysis

SEM and X-ray Microanalysis Image Formation and Interpretation

آنالیز اشعه ایکس و SEM - تفسیر و تشکیل تصویر

ABSTRACT

Scanning electron microscopy is a technique in which images form the major avenue of information to the user. A great measure of the enormous popularity of the SEM arises from the ease with which useful images can be obtained. Modern instruments incorporate many computer-controlled, automatic features that permit even a new user to rapidly obtain images that contain fine detail and features that are readily visible, even at scanning rates up to that of television (TV) display. Although such automatic “computer-aided” microscopy provides a powerful tool capable of solving many problems, there will always remain a class of problems for which the general optimized solution may not be sufficient.