آنالیز میکروسکوپ تونلی روبشی STM و میکروسکوپ نیروی روبشی SFM

scanning tunneling microscope (STM) 

Scanning Force Microscopy (SFM)

آنالیز میکروسکوپ تونلی روبشی STM و میکروسکوپ نیروی روبشی  SFM

ABSTRACT

Scanning tunneling microscopy (STM) and its offspring, scanning force microscopy (SFM) , are real-space imaging techniques that can produce topographic images of a surface with atomic resolution in all three dimensions. Almost any solid surface can be studied with STM or SFM : insulators, semiconductors, and conductors, transparent as well as opaque materials. Surfaces can be studied in air, in liquid, or in ultrahigh vacuum, with fields of view from atoms to greater than 250*250um. With this flexibility in both the operating environment and types of samples that can be studied, STM/SFM is a powerful imaging system.